IEEE DTTIS conference (International Conference on Design, Test and Technology of Integrated Systems) is the result of merging two established IEEE conferences: IEEE DTIS (International Conference on Design and Technology of Integrated Systems in nanoscale era), and IEEE DTS (International Conference on Design and Test of Integrated Systems).

The aim of the Conference is to cope with the rapidly progressing technology which, today, reaches the nanometer scale. The areas of interest include the design, test and technology of electronic products, ranging from integrated circuit modules and printed circuit boards to full systems and microsystems, as well as the methodologies and tools used in the design, verification and validation of such products.

IEEE DTTIS is an opportunity for researchers to present and discuss their latest work. IEEE DTTIS is, by design, a forum for engineers, researchers, graduate students and professors, to cross the design-technology boundary by bringing design, test, technology, and process experts together. The conference is organized annually in a Mediterranean country.

All accepted and presented papers will be published on the IEEE DTTIS Conference Proceedings and submitted for publication in IEEE Xplore.

Authors of accepted papers will be invited to submit an extended version of their work to a Special Issue of a selected journal.